Microprocessor free run testing

Τίτλος

Microprocessor free run testing

Θέμα

Microcontrollers--Design and construction

Δημιουργός

Nugent, Michael

Πηγή

Higher Technical Institute

Το πλήρες κείμενο είναι διαθέσιμο από το Υπουργείο Ενέργειας, Εμπορίου Βιομηχανίας και Τουρισμού

Εκδότης

Library of Cyprus University of Technology

Ημερομηνία

1990

Δικαιώματα

Απαγορεύεται η δημοσίευση ή αναπαραγωγή, ηλεκτρονική ή άλλη χωρίς τη γραπτή συγκατάθεση του δημιουργού και κάτοχου των πνευματικών δικαιωμάτων.

Μορφή

pdf

Γλώσσα

eng

Τύπος

text

Αναγνωριστικό

EED0111

Σύνοψη

The objectives of this project were to study the testing
methods available when a microcontroller is Free-Running and to apply these methods for fault finding on a microcontroller. The project is therefore divided into two main parts. The construction of the microcontroller to be tested and the study and application of the fault finding techniques and instruments on this microcontroller.
Construction: The Z80 8-bit family of components was used in the construction because this is superior in both
software and hardware capabilities to most 8-bit
microcomputer systems on the market. To explore these capabilities apart from the Central Processing Unit ( CPU) and Memory , the Z80 Serial ( DART) and Parallel ( PIO ) Input/Output devices and the Z80 Clock Timer eircuit( eTe ) were included in the construction. This microcontroller communicates with an ATARI terminal via serial transmission which is enabled using the eTe for the generation of the baud rates and the SIO for the interfacing circuit. Fault finding techniques and instruments: First, various troubleshooting instruments were examined, starting from the simple hand held instruments and their applications and going to the more sophisticated ones ( Logic and Signature
Analyser) Next, the techniques were analysed and these
included the Free-Run Test and Self Test programs This
microcontroller is capable of testing 2K RAM chips by using certain Self Test routines, an application also examined in the Self Test techniques.
By following the above sequence the troubleshooting
techniques were studied and the Free Run test was carried out being fully aware of hardware and software aspects of the Z80 based system. Also, since the instruments were examined with reference to existing ones in the workshop, the Free Run test was carried out both easier and with more efficiency .